完整後設資料紀錄
DC 欄位語言
dc.contributor.authorTan, Chuan-Yaoen_US
dc.contributor.authorJiang, Iris Hui-Ruen_US
dc.date.accessioned2014-12-08T15:20:29Z-
dc.date.available2014-12-08T15:20:29Z-
dc.date.issued2011en_US
dc.identifier.isbn978-1-61284-857-0en_US
dc.identifier.issn1548-3746en_US
dc.identifier.urihttp://hdl.handle.net/11536/14576-
dc.description.abstractIn order to reduce the re-spin cost, metal-only ECO rewires spare cells to realize incremental design changes by changing only the masks of metal layers. Metal-only ECO is widely adopted at IC design houses to resolve last found functional and/or timing failures. This task is challenging because these errors in modern IC design may be many, but the pre-injected spare cells are limited in quantity, in cell types, and in physical locations. In this paper, we first introduce the metal-only ECO flow and survey recent techniques for logic difference extraction, functional ECO and timing ECO optimization.en_US
dc.language.isoen_USen_US
dc.subjectECOen_US
dc.subjectspare cellsen_US
dc.subjecttechnology remappingen_US
dc.titleRecent Research Development in Metal-Only ECOen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2011 IEEE 54TH INTERNATIONAL MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS (MWSCAS)en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000296057200270-
顯示於類別:會議論文