完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Tan, Chuan-Yao | en_US |
dc.contributor.author | Jiang, Iris Hui-Ru | en_US |
dc.date.accessioned | 2014-12-08T15:20:29Z | - |
dc.date.available | 2014-12-08T15:20:29Z | - |
dc.date.issued | 2011 | en_US |
dc.identifier.isbn | 978-1-61284-857-0 | en_US |
dc.identifier.issn | 1548-3746 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/14576 | - |
dc.description.abstract | In order to reduce the re-spin cost, metal-only ECO rewires spare cells to realize incremental design changes by changing only the masks of metal layers. Metal-only ECO is widely adopted at IC design houses to resolve last found functional and/or timing failures. This task is challenging because these errors in modern IC design may be many, but the pre-injected spare cells are limited in quantity, in cell types, and in physical locations. In this paper, we first introduce the metal-only ECO flow and survey recent techniques for logic difference extraction, functional ECO and timing ECO optimization. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | ECO | en_US |
dc.subject | spare cells | en_US |
dc.subject | technology remapping | en_US |
dc.title | Recent Research Development in Metal-Only ECO | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | 2011 IEEE 54TH INTERNATIONAL MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS (MWSCAS) | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000296057200270 | - |
顯示於類別: | 會議論文 |