Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lang, Jaw-Yeu | en_US |
dc.contributor.author | Pai, Yun-Chieh | en_US |
dc.contributor.author | Lam, Tu-Ngoc | en_US |
dc.contributor.author | Lin, Wen-Chin | en_US |
dc.contributor.author | Chan, Ting-Shan | en_US |
dc.contributor.author | Lai, Chih-Huang | en_US |
dc.contributor.author | Tseng, Yuan-Chieh | en_US |
dc.date.accessioned | 2018-08-21T05:54:19Z | - |
dc.date.available | 2018-08-21T05:54:19Z | - |
dc.date.issued | 2017-07-10 | en_US |
dc.identifier.issn | 0003-6951 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1063/1.4993158 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/145796 | - |
dc.description.abstract | This paper reports on a magnetic device with a [Co40Pd60/Cu](10)/Fe structure for use in the detection of H-2. In a magneto-optical, transport, and gas-detection system, the proposed device presented sharp, reproducible H-2-dependent magnetic/electrical properties. The device's saturation magnetization (induced resistance change) dropped (increased) by a factor of similar to 5 when a H-2 pressure of 75 kPa is given. Besides, the electrical signal-to-noise ratio of the device can be restored similar to 50% by exposing it to a magnetic field of 1000 Oe, even when the sensitivity of the device dropped at a low H-2 pressure (0.7 KPa). This demonstrates the applicability of the device for use as a low-pressure H-2 detector. Operando x-ray spectroscopy revealed that changes in H-2-induced magnetism arose from a Co-Pd charge transfer effect coupled to changes in the local-structure symmetry. Published by AIP Publishing. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Using magnetic structure of Co40Pd60/Cu for the sensing of hydrogen | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1063/1.4993158 | en_US |
dc.identifier.journal | APPLIED PHYSICS LETTERS | en_US |
dc.citation.volume | 111 | en_US |
dc.contributor.department | 材料科學與工程學系 | zh_TW |
dc.contributor.department | Department of Materials Science and Engineering | en_US |
dc.identifier.wosnumber | WOS:000405661700051 | en_US |
Appears in Collections: | Articles |