標題: Predicting Vt Variation and Static IR Drop of Ring Oscillators Using Model-Fitting Techniques
作者: Huang, Tzu-Hsuan
Hung, Wei-Tse
Yang, Hao-Yu
Chang, Wen-Hsiang
Chen, Ying-Yen
Kuo, Chun-Yi
Lee, Jih-Nung
Chao, Mango C. -T.
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 1-Jan-2017
摘要: This paper presents a statistical model-fitting framework to efficiently decompose the impact of device Vt variation and power-network IR drop from the measured ring-oscillator frequencies without adding any extra circuitry to the original ring oscillators. The framework applies Gaussian process regression as its core model-fitting technique and stepwise regression as a preprocess to select significant predictor features. The experiments conducted based on the SPICE simulation of an industrial 28nm technology demonstrate that our framework can simultaneously predict the NMOS Vt, PMOS Vt and static IR drop of the ring oscillators based on their frequencies measured at different external supply voltages. The final resulting R squares of the predicted features are all more than 99.93%.
URI: http://hdl.handle.net/11536/146662
ISSN: 2153-6961
期刊: 2017 22ND ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE (ASP-DAC)
起始頁: 426
結束頁: 431
Appears in Collections:Conferences Paper