Title: Data Analysis and Prediction for NAND Flash Decoding Status
Authors: Liao, Yen-Chin
Huang, Ching-Hui
Zeng, Cloud
Chang, Hsie-Chia
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
Issue Date: 1-Jan-2017
Abstract: This paper investigates the feasibility of predicting the NAND flash decoding status by machine learning algorithms. The memory system can handle the future decoding failure in advance according to the prediction results so that to relieve the penalties. Several data preprocessing techniques to improve the accuracy are addressed. A thorough analysis flow is given and the experimental results show significant improvements. Incorporating with proper memory error handling schemes, a 34% improvement in throughput can be achieved.
URI: http://hdl.handle.net/11536/146695
ISSN: 2330-7978
Journal: 2017 IEEE 9TH INTERNATIONAL MEMORY WORKSHOP (IMW)
Begin Page: 40
End Page: 43
Appears in Collections:Conferences Paper