標題: | Investigation and Comparison of Design Space for Ultra-Thin-Body GeOI/SOI Negative Capacitance FETs |
作者: | Lee, Ho-Pei Yu, Chien-Lin You, Wei-Xiang Su, Pin 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
公開日期: | 1-一月-2017 |
URI: | http://hdl.handle.net/11536/146759 |
ISSN: | 1930-8868 |
期刊: | 2017 INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY, SYSTEMS AND APPLICATION (VLSI-TSA) |
顯示於類別: | 會議論文 |