標題: Investigation and Comparison of Design Space for Ultra-Thin-Body GeOI/SOI Negative Capacitance FETs
作者: Lee, Ho-Pei
Yu, Chien-Lin
You, Wei-Xiang
Su, Pin
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 1-一月-2017
URI: http://hdl.handle.net/11536/146759
ISSN: 1930-8868
期刊: 2017 INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY, SYSTEMS AND APPLICATION (VLSI-TSA)
顯示於類別:會議論文