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dc.contributor.authorChen, Chia-Ien_US
dc.contributor.authorLee, Bau-Chengen_US
dc.contributor.authorHuang, Juinn-Daren_US
dc.date.accessioned2018-08-21T05:56:53Z-
dc.date.available2018-08-21T05:56:53Z-
dc.date.issued2011-01-01en_US
dc.identifier.issn1530-1591en_US
dc.identifier.urihttp://hdl.handle.net/11536/146782-
dc.description.abstractThe emerging 3D technology, which stacks multiple dies within a single chip and utilizes through-silicon vias (TSVs) as vertical connections, is considered a promising solution for achieving better performance and easy integration. Similarly, a generic 2D FPGA architecture can evolve into a 3D one by extending its signal switching scheme from 2D to 3D by means of TSVs. However, replacing all 2D switch boxes (SBs) by 3D ones with full vertical connectivity is found both area-consuming and resource-squandering. Therefore, it is possible to greatly reduce the footprint with only minor delay increase by properly tailoring the structure and deployment strategy of 3D SB. In this paper, we perform a comprehensive architectural exploration of 3D FPGAs. Various architectural alternatives are proposed and then evaluated thoroughly to pick out the most appropriate ones with a better balance between area and delay. Finally, we recommend several configurations for generic 3D FPGA architectures, which can save up to 52% area with virtually no delay penalty.en_US
dc.language.isoen_USen_US
dc.subject3D ICsen_US
dc.subject3D FPGAsen_US
dc.subjectarchitectural explorationen_US
dc.subjectarea/delay trade-offen_US
dc.titleArchitectural Exploration of 3D FPGAs towards a Better Balance between Area and Delayen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2011 DESIGN, AUTOMATION & TEST IN EUROPE (DATE)en_US
dc.citation.spage587en_US
dc.citation.epage590en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000410278900113en_US
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