完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Chang, Shyh-Ming | en_US |
dc.contributor.author | Kao, Kuo-Shu | en_US |
dc.contributor.author | An, Chao-Chyun | en_US |
dc.contributor.author | Chen, Ming-Yao | en_US |
dc.contributor.author | Tsang, Jimmy | en_US |
dc.contributor.author | Yang, Sheng-Shu | en_US |
dc.contributor.author | Chen, Chih | en_US |
dc.contributor.author | Lin, Chung-Kuang | en_US |
dc.contributor.author | Chen, Wen-Chih | en_US |
dc.date.accessioned | 2018-08-21T05:56:58Z | - |
dc.date.available | 2018-08-21T05:56:58Z | - |
dc.date.issued | 2007-01-01 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/146877 | - |
dc.description.abstract | Non-Conductive-Film (NCF) bonding method ensures the micro-order direct bonding between the IC electrode and circuit substrate electrode. The binding force of the applied adhesive achieves electrical connections between the bumps on the IC chip and the electrodes on the substrate. The stress analysis results are used to identify the appropriate temperature range for the given NCF bonding structure. Both analytical and experimental results demonstrate the feasibility of using the compliant bumps to achieve a high compressive stress and low as well as stable connection resistance at various environmental temperatures. | en_US |
dc.language.iso | en_US | en_US |
dc.title | The brand-new high density "NCF=-type compliant-bumped COG" in high resolution LCD | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | IDMC'07: PROCEEDINGS OF THE INTERNATIONAL DISPLAY MANUFACTURING CONFERENCE 2007 | en_US |
dc.citation.spage | 413 | en_US |
dc.contributor.department | 材料科學與工程學系 | zh_TW |
dc.contributor.department | Department of Materials Science and Engineering | en_US |
dc.identifier.wosnumber | WOS:000258177700106 | en_US |
顯示於類別: | 會議論文 |