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dc.contributor.authorCheng, Chiao-Hungen_US
dc.contributor.authorLin, Li-Chien_US
dc.contributor.authorLin, Jian-Heen_US
dc.contributor.authorChen, Ke-Horngen_US
dc.contributor.authorLin, Ying-Hsien_US
dc.contributor.authorLin, Jian-Ruen_US
dc.contributor.authorTsai, Tsung-Yenen_US
dc.date.accessioned2018-08-21T05:57:04Z-
dc.date.available2018-08-21T05:57:04Z-
dc.date.issued2017-01-01en_US
dc.identifier.urihttp://hdl.handle.net/11536/146994-
dc.description.abstractthe proposed dynamic voltage scaling (DVS) based burst mode links the DVS technique in a system on a chip (SoC) and the burst mode operation of the DC-DC converter for further efficiency improving. Conventional burst mode has only one entrance transition point (ETP) between the pulse width modulation (PWM) and the burst mode, so the voltage ripple is high at low DVS voltage while the efficiency is low at high DVS voltage. The proposed DVS-based burst mode uses the automatic entrance point control (AEPC) technique to decide multiple ETP values corresponding to the voltage identification (VID) code from the SoC. The quality enhancement technique deliberately adjusts the burst reference voltage to further reduce the output ripple with acceptable loss of efficiency. The tested DC-DC boost converter with the DVS-based burst mode technique is fabricated in 0.18 mu m CMOS process. Measurement results show that the efficiency is higher than 85% when the output voltage varies from 1.8V to 3.2V (controlled by the DVS) and load current ranges from 0.1mA to 140mA, with peak efficiency 94%.en_US
dc.language.isoen_USen_US
dc.titleA DVS-Based Burst Mode with Automatic Entrance Point Control Technique in DC-DC Boost Converter for Wearable Devices and IoT Applicationsen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2017 IEEE ASIAN SOLID-STATE CIRCUITS CONFERENCE (A-SSCC)en_US
dc.citation.spage121en_US
dc.citation.epage124en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000426511300031en_US
Appears in Collections:Conferences Paper