完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Tsai, Yi-Chia | en_US |
dc.contributor.author | Li, Yiming | en_US |
dc.date.accessioned | 2018-08-21T05:57:08Z | - |
dc.date.available | 2018-08-21T05:57:08Z | - |
dc.date.issued | 2017-01-01 | en_US |
dc.identifier.issn | 1946-1569 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/147094 | - |
dc.description.abstract | To get an accurate prediction of the geometry and electronic structure of two-dimensional materials, the use of functionals for the exchange-correlation and the van der Waals corrections are consequential. We present a more rigorous simulation procedure by adopting different exchange-correlation functionals for geometry relaxation and electronic structure calculation. As the results, by using Perdew-Burke-Ernzerhof (PBE) functional, the geometry and the bandgap of the bulk transition metals dichalcogenides can be satisfied in comparison with the experimental measurement. It should, however, incorporate the Heyd-Scuseria-Ernzerhof (HSE06) functional and DFT-D2 van der Waals correction at the same time to reproduce a close geometry and bandgap of bulk black phosphorus (BP). A large cell calculation for BP, such as contact engineering and doping engineering, can thus take the advantage of accuracy while remains time efficiency. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | van der Waals | en_US |
dc.subject | exchange-correlation functionals | en_US |
dc.subject | density functional theory | en_US |
dc.subject | two-dimensional material | en_US |
dc.title | On Electronic Structure and Geometry of MoX2 (X = S, Se, Te) and Black Phosphorus by ab initio Simulation with Various van der Waals Corrections | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | 2017 INTERNATIONAL CONFERENCE ON SIMULATION OF SEMICONDUCTOR PROCESSES AND DEVICES (SISPAD 2017) | en_US |
dc.citation.spage | 169 | en_US |
dc.citation.epage | 172 | en_US |
dc.contributor.department | 電機工程學系 | zh_TW |
dc.contributor.department | Department of Electrical and Computer Engineering | en_US |
dc.identifier.wosnumber | WOS:000426983300043 | en_US |
顯示於類別: | 會議論文 |