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dc.contributor.authorHuang, Shen-Cheen_US
dc.contributor.authorLi, Hengen_US
dc.contributor.authorLee, Yu-Shanen_US
dc.contributor.authorHung, Chen-Haoen_US
dc.contributor.authorWang, Shing-Chungen_US
dc.contributor.authorChen, Hsiangen_US
dc.contributor.authorLu, Tien-Changen_US
dc.date.accessioned2018-08-21T05:57:11Z-
dc.date.available2018-08-21T05:57:11Z-
dc.date.issued2017-01-01en_US
dc.identifier.urihttp://hdl.handle.net/11536/147165-
dc.description.abstractWe illustrated the reliability of longer wavelength ultraviolet light-emitting diodes (UVLEDs) in salty vapour environment under manipulation of forward-bias stress via consistent electrical and material characterizations. By manipulating the unprecedented operation in salty vapour ambient, we investigated a series of remarkable findings related to origin of failure behaviours.en_US
dc.language.isoen_USen_US
dc.titleReliability Analysis of GaN-based UVLEDs under forward bias operations in salty vapor environmenten_US
dc.typeProceedings Paperen_US
dc.identifier.journal2017 22ND MICROOPTICS CONFERENCE (MOC)en_US
dc.citation.spage306en_US
dc.citation.epage307en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000427705300139en_US
Appears in Collections:Conferences Paper


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