Reliability Analysis of GaN-based UVLEDs under forward bias operations in salty vapor environment

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DC 欄位	值	語言
dc.contributor.author	Huang, Shen-Che	en_US
dc.contributor.author	Li, Heng	en_US
dc.contributor.author	Lee, Yu-Shan	en_US
dc.contributor.author	Hung, Chen-Hao	en_US
dc.contributor.author	Wang, Shing-Chung	en_US
dc.contributor.author	Chen, Hsiang	en_US
dc.contributor.author	Lu, Tien-Chang	en_US
dc.date.accessioned	2018-08-21T05:57:11Z	-
dc.date.available	2018-08-21T05:57:11Z	-
dc.date.issued	2017-01-01	en_US
dc.identifier.uri	http://hdl.handle.net/11536/147165	-
dc.description.abstract	We illustrated the reliability of longer wavelength ultraviolet light-emitting diodes (UVLEDs) in salty vapour environment under manipulation of forward-bias stress via consistent electrical and material characterizations. By manipulating the unprecedented operation in salty vapour ambient, we investigated a series of remarkable findings related to origin of failure behaviours.	en_US
dc.language.iso	en_US	en_US
dc.title	Reliability Analysis of GaN-based UVLEDs under forward bias operations in salty vapor environment	en_US
dc.type	Proceedings Paper	en_US
dc.identifier.journal	2017 22ND MICROOPTICS CONFERENCE (MOC)	en_US
dc.citation.spage	306	en_US
dc.citation.epage	307	en_US
dc.contributor.department	光電工程學系	zh_TW
dc.contributor.department	Department of Photonics	en_US
dc.identifier.wosnumber	WOS:000427705300139	en_US
顯示於類別：	會議論文