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dc.contributor.authorLin, J. Y.en_US
dc.contributor.authorChou, Y. T.en_US
dc.contributor.authorShen, J. L.en_US
dc.contributor.authorYang, M. D.en_US
dc.contributor.authorWu, C. H.en_US
dc.contributor.authorChi, G. C.en_US
dc.contributor.authorChou, W. C.en_US
dc.contributor.authorKo, C. H.en_US
dc.date.accessioned2014-12-08T15:20:43Z-
dc.date.available2014-12-08T15:20:43Z-
dc.date.issued2011-10-15en_US
dc.identifier.issn0169-4332en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.apsusc.2011.08.073en_US
dc.identifier.urihttp://hdl.handle.net/11536/14735-
dc.description.abstractThe structural properties of TiO(2) nanotubes with rapid thermal annealing (RTA) and traditional thermal annealing in O(2) were studied by X-ray diffraction (XRD) and Raman scattering measurements. From analyzing the line width of XRD and the correlation length of the Raman peak, we demonstrate that RTA can be an effective tool for amorphous-anatase transformation in TiO(2) nanotubes. The Raman peak redshifts and reduces its line width after thermal annealing and RTA, which may involves the reduction of oxygen-related defects. (C) 2011 Elsevier B. V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.titleEffects of rapid thermal annealing on the structural properties of TiO(2) nanotubesen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.apsusc.2011.08.073en_US
dc.identifier.journalAPPLIED SURFACE SCIENCEen_US
dc.citation.volume258en_US
dc.citation.issue1en_US
dc.citation.spage530en_US
dc.citation.epage534en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.contributor.departmentDepartment of Photonicsen_US
Appears in Collections:Articles