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dc.contributor.authorJiang, Jieen_US
dc.contributor.authorBitla, Yugandharen_US
dc.contributor.authorPeng, Qiang-xiangen_US
dc.contributor.authorZhou, Yi-Chunen_US
dc.contributor.authorChu, Ying-Haoen_US
dc.date.accessioned2019-04-02T05:57:54Z-
dc.date.available2019-04-02T05:57:54Z-
dc.date.issued2018-04-01en_US
dc.identifier.issn1940-087Xen_US
dc.identifier.urihttp://dx.doi.org/10.3791/57221en_US
dc.identifier.urihttp://hdl.handle.net/11536/148115-
dc.description.abstractFlexible non-volatile memories have received much attention as they are applicable for portable smart electronic device in the future, relying on high-density data storage and low-power consumption capabilities. However, the high-quality oxide based nonvolatile memory on flexible substrates is often constrained by the material characteristics and the inevitable high-temperature fabrication process. In this paper, a protocol is proposed to directly grow an epitaxial yet flexible lead zirconium titanate memory element on muscovite mica. The versatile deposition technique and measurement method enable the fabrication of flexible yet single-crystalline non-volatile memory elements necessary for the next generation of smart devices.en_US
dc.language.isoen_USen_US
dc.subjectEngineeringen_US
dc.subjectIssue 134en_US
dc.subjectFlexible electronicsen_US
dc.subjectflexible nonvolatile memoryen_US
dc.subjectmuscovite micaen_US
dc.subjectvan der Waals epitaxyen_US
dc.titleA Fabrication and Measurement Method for a Flexible Ferroelectric Element Based on Van Der Waals Heteroepitaxyen_US
dc.typeArticleen_US
dc.identifier.doi10.3791/57221en_US
dc.identifier.journalJOVE-JOURNAL OF VISUALIZED EXPERIMENTSen_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000444051300059en_US
dc.citation.woscount0en_US
Appears in Collections:Articles