完整後設資料紀錄
DC 欄位語言
dc.contributor.authorJuang, Jing-Yeen_US
dc.contributor.authorLu, Chia-Lingen_US
dc.contributor.authorChen, Kuan-Juen_US
dc.contributor.authorChen, Chao-Chang A.en_US
dc.contributor.authorHsu, Po-Ningen_US
dc.contributor.authorChen, Chihen_US
dc.contributor.authorTu, K. N.en_US
dc.date.accessioned2019-04-02T06:00:47Z-
dc.date.available2019-04-02T06:00:47Z-
dc.date.issued2018-09-17en_US
dc.identifier.issn2045-2322en_US
dc.identifier.urihttp://dx.doi.org/10.1038/s41598-018-32280-xen_US
dc.identifier.urihttp://hdl.handle.net/11536/148149-
dc.description.abstractA vacuum-free Cu-to-Cu direct bonding by using (111)-oriented and nanotwinned Cu has been achieved. A fast bonding process occurs in 5 min under a temperature gradient between 450 and 100 degrees C. It is verified by grain growth across the bonded interface. To investigate the grain growth behavior, further annealing in the temperature gradient, as well as in a reversed temperature gradient, was performed. They showed similar recrystallization behavior with de-twinning. To analyze the de-twinning, we recall the classic model of annealing twin formation by Fullman and Fisher as comparison. Our case is opposite to the model of Fullman and Fisher. A mechanism of direct bonding by surface diffusion creep is proposed.en_US
dc.language.isoen_USen_US
dc.titleCopper-to-copper direct bonding on highly (111)-oriented nanotwinned copper in no-vacuum ambienten_US
dc.typeArticleen_US
dc.identifier.doi10.1038/s41598-018-32280-xen_US
dc.identifier.journalSCIENTIFIC REPORTSen_US
dc.citation.volume8en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000444762700040en_US
dc.citation.woscount1en_US
顯示於類別:期刊論文