標題: GaN-Based LEDs Grown on HVPE Growth High Crystalline Quality Thick GaN Template
作者: Lin, D. W.
Lin, C. C.
Chiu, C. H.
Lee, C. Y.
Yang, Y. Y.
Li, Z. Y.
Lai, W. C.
Lu, T. C.
Kuo, H. C.
Wang, S. C.
光電系統研究所
光電工程學系
Institute of Photonic System
Department of Photonics
公開日期: 2011
摘要: In this study, high crystalline quality 30 mu m thick gallium nitride (GaN) films were grown by hydride vapor phase epitaxy (HVPE) on sapphire substrate, and the thick GaN films were used for developing high performance light-emitting diodes (LEDs). By using high-resolution X-ray diffraction, the full width at half-maximum (FWHM) of the rocking curve shows that this 30 mu m thick GaN template had high crystalline quality. In addition, the transmission electron microscopy (TEM) images suggest that threading dislocation densities (TDDs) are almost free in multiple quantum wells (MQWs) for LEDs grown on 30 mu m thick GaN template. Compared with conventional LEDs grown on sapphire, LEDs grown on 30 mu m thick GaN template exhibit 26% enhancement of light output at 20 mA. (C) 2011 The Electrochemical Society. [DOI: 10.1149/2.003111jes] All rights reserved.
URI: http://hdl.handle.net/11536/14827
http://dx.doi.org/10.1149/2.003111jes
ISSN: 0013-4651
DOI: 10.1149/2.003111jes
期刊: JOURNAL OF THE ELECTROCHEMICAL SOCIETY
Volume: 158
Issue: 11
起始頁: H1103
結束頁: H1106
顯示於類別:期刊論文


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