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dc.contributor.authorKer, Ming-Douen_US
dc.contributor.authorYen, Cheng-Chengen_US
dc.date.accessioned2014-12-08T15:20:53Z-
dc.date.available2014-12-08T15:20:53Z-
dc.date.issued2012-02-01en_US
dc.identifier.issn0278-0046en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TIE.2011.2157292en_US
dc.identifier.urihttp://hdl.handle.net/11536/14877-
dc.description.abstractA new on-chip 4-bit transient-to-digital converter for system-level electrostatic discharge (ESD) protection design is proposed. The proposed converter is designed to detect ESD-induced transient disturbances and transfer different ESD voltages into digital codes under system-level ESD tests. The experimental results in a 0.13-mu m CMOS integrated circuit with 1.8-V devices have confirmed the detection function and digital output codes. The proposed on-chip transient-to-digital converter can be code-signed with firmware operations to effectively enhance immunity of display systems against system-level ESD stresses.en_US
dc.language.isoen_USen_US
dc.subjectConverteren_US
dc.subjectelectromagnetic compatibilityen_US
dc.subjectelectrostatic discharge (ESD)en_US
dc.subjectsystem-level ESD testen_US
dc.subjecttransient detection circuiten_US
dc.titleNew 4-Bit Transient-to-Digital Converter for System-Level ESD Protection in Display Panelsen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TIE.2011.2157292en_US
dc.identifier.journalIEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICSen_US
dc.citation.volume59en_US
dc.citation.issue2en_US
dc.citation.spage1278en_US
dc.citation.epage1287en_US
dc.contributor.department電機學院zh_TW
dc.contributor.departmentCollege of Electrical and Computer Engineeringen_US
dc.identifier.wosnumberWOS:000296014800062-
dc.citation.woscount2-
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