標題: One Bipolar Selector-One Resistor for Flexible Crossbar Memory Applications
作者: Kumar, Dayanand
Aluguri, Rakesh
Chand, Umesh
Tseng, Tseung-Yuen
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
關鍵字: One selector-one resistor (1S1R);resistive random accessmemory (RRAM);resistive switching;Zener tunneling
公開日期: 1-三月-2019
摘要: A bipolar, highly nonlinear n-p-n selector is coupled in series with resistive switching memory device to suppress the sneak path current. The memory characteristics are measured for the crossbar array fabricated on a flexible polyethylene terephthalate substrate. Dominant conduction mechanism is the Zener tunneling to obtain the high nonlinearity in the selector device. This phenomenon validates the I-V characteristics which are temperature dependent, which leads to decrease in the turn-on voltage of the device as the temperature increases. The proposed one bipolar selector-one resistor device demonstrates better memory characteristics with the high nonlinearity (similar to 10(3)), observable memory window of about one order, excellent ac endurance (10(7)) cycles, fast switching speed (60 ns), and stable retention (10(4) s) at 100 degrees C. The results show the substantial potential of the proposedone selector-one-resistor structure in suppressing the leakage current, making it attractive for future high-density flexible crossbar memory array.
URI: http://dx.doi.org/10.1109/TED.2019.2895416
http://hdl.handle.net/11536/149011
ISSN: 0018-9383
DOI: 10.1109/TED.2019.2895416
期刊: IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume: 66
起始頁: 1296
結束頁: 1301
顯示於類別:期刊論文