完整後設資料紀錄
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dc.contributor.authorLu, Cheng-Hsienen_US
dc.contributor.authorKho, Yi-Tungen_US
dc.contributor.authorChen, Chiao-Peien_US
dc.contributor.authorTsai, Bin-Lingen_US
dc.contributor.authorChen, Kuan-Nengen_US
dc.date.accessioned2019-04-02T05:59:00Z-
dc.date.available2019-04-02T05:59:00Z-
dc.date.issued2019-03-01en_US
dc.identifier.issn2156-3950en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TCPMT.2019.2895515en_US
dc.identifier.urihttp://hdl.handle.net/11536/149028-
dc.description.abstractThis paper investigates polymer/metal hybrid bonding structure using conventional polyimide and modified polyimide-like material. Adhesion properties between bonding material and passivation layer were evaluated by four-point bending method, atomic force microscopy, water contact angle measurement, and X-ray photoelectron spectroscopy. Various annealing temperatures were applied to verify the reliability under thermal stress. The results show that the modified polyimide-like material with the curing temperature below 250 degrees C has better adhesion than the conventional polyimide. This modified polyimide material can be used in low-temperature hybrid bonding technology for advanced integration.en_US
dc.language.isoen_USen_US
dc.subjectAdhesionen_US
dc.subjectfour-point bendingen_US
dc.subjecthybrid bondingen_US
dc.subjectpolyimideen_US
dc.subjectX-ray photoelectron spectroscopy (XPS)en_US
dc.titleAdhesion and Material Properties Between Polyimide and Passivation Layers for Polymer/Metal Hybrid Bonding in 3-D Integrationen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TCPMT.2019.2895515en_US
dc.identifier.journalIEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGYen_US
dc.citation.volume9en_US
dc.citation.spage412en_US
dc.citation.epage418en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000461334400004en_US
dc.citation.woscount0en_US
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