THE STUDY OF APPARENT NEGATIVE VALUE IN MEASURING DIELECTRIC LOSS

Full metadata record

DC Field	Value	Language
dc.contributor.author	LIU, YN	en_US
dc.contributor.author	LIU, CC	en_US
dc.date.accessioned	2019-04-02T05:59:05Z	-
dc.date.available	2019-04-02T05:59:05Z	-
dc.date.issued	1982-01-01	en_US
dc.identifier.issn	0018-9367	en_US
dc.identifier.uri	http://hdl.handle.net/11536/149054	-
dc.language.iso	en_US	en_US
dc.title	THE STUDY OF APPARENT NEGATIVE VALUE IN MEASURING DIELECTRIC LOSS	en_US
dc.type	Article	en_US
dc.identifier.journal	IEEE TRANSACTIONS ON ELECTRICAL INSULATION	en_US
dc.citation.volume	17	en_US
dc.citation.spage	20	en_US
dc.citation.epage	26	en_US
dc.identifier.wosnumber	WOS:A1982NA94900004	en_US
dc.citation.woscount	2	en_US
Appears in Collections:	Articles