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dc.contributor.authorChiu, MHen_US
dc.contributor.authorSu, DCen_US
dc.date.accessioned2019-04-03T06:38:50Z-
dc.date.available2019-04-03T06:38:50Z-
dc.date.issued1997-06-01en_US
dc.identifier.issn0091-3286en_US
dc.identifier.urihttp://dx.doi.org/10.1117/1.601200en_US
dc.identifier.urihttp://hdl.handle.net/11536/149542-
dc.description.abstractA new optical method for angle measurement based on total-internal-reflection heterodyne interferometry is presented. In this method, heterodyne interferometry is applied to measure the phase difference between s and p polarization states at total internal reflection. This phase difference depends on the angle of incidence. Hence, small-angle measurement can be performed only by evaluating this phase difference. The validity of the method is demonstrated, and it has a measurement range of 10 deg. Its resolution depends on the angle of incidence; the best resolution is 8x10(-5) deg. (C) 1997 Society of Photo-Optical Instrumentation Engineers.en_US
dc.language.isoen_USen_US
dc.subjectangle measurementen_US
dc.subjecttotal-internal-reflection effecten_US
dc.subjectheterodyne interferometryen_US
dc.titleAngle measurement using total-internal-reflection heterodyne interferometryen_US
dc.typeArticleen_US
dc.identifier.doi10.1117/1.601200en_US
dc.identifier.journalOPTICAL ENGINEERINGen_US
dc.citation.volume36en_US
dc.citation.issue6en_US
dc.citation.spage1750en_US
dc.citation.epage1753en_US
dc.contributor.department光電工程研究所zh_TW
dc.contributor.departmentInstitute of EO Enginerringen_US
dc.identifier.wosnumberWOS:A1997XD38800026en_US
dc.citation.woscount46en_US
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