Improved technique for measuring small angles

doi:10.1364/AO.36.007104

標題:	Improved technique for measuring small angles
作者:	Chiu, MH Su, DC 光電工程研究所 Institute of EO Enginerring
關鍵字:	total-internal-reflection effect;heterodyne interferometry
公開日期:	1-十月-1997
摘要:	Based on the total-internal-reflection effect and heterodyne interferometry, an improved technique for measuring small angles is proposed. This technique not only expands the measurement range but it also improves measurement performances. Its validity is demonstrated. (C) 1997 Optical Society of America.
URI:	http://dx.doi.org/10.1364/AO.36.007104 http://hdl.handle.net/11536/149647
ISSN:	0003-6935
DOI:	10.1364/AO.36.007104
期刊:	APPLIED OPTICS
Volume:	36
起始頁:	7104
結束頁:	7106
顯示於類別：	期刊論文