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dc.contributor.authorChiang, Chin-Teen_US
dc.contributor.authorFung, Carrson C.en_US
dc.date.accessioned2014-12-08T15:21:02Z-
dc.date.available2014-12-08T15:21:02Z-
dc.date.issued2011-09-01en_US
dc.identifier.issn0018-9545en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TVT.2011.2161640en_US
dc.identifier.urihttp://hdl.handle.net/11536/14957-
dc.description.abstractA robust superimposed training sequence design is proposed for spatially correlated multiple-input-multiple-output (MIMO) channel estimation. The proposed scheme does not require accurate knowledge of the spatial correlation matrix, and it is shown to outperform previously proposed robust correlated MIMO channel estimators, such as relaxed minimum mean square error (RMMSE) and least-square RMMSE. Since the training sequence is overlaid into the data stream, the spectral efficiency of the system is higher than those that use time-multiplexed pilots. A solution for the sequence can easily be obtained by using a projection on convex-set-based iterative algorithm that is guaranteed to converge as long as the training sequence matrix is initialized to have full rank. Furthermore, it is shown that the proposed scheme is identical to the RMMSE-based schemes when the MIMO channel is spatially uncorrelated. The computational complexity of the proposed algorithm is also illustrated.en_US
dc.language.isoen_USen_US
dc.subjectAffine precoderen_US
dc.subjectmajorizationen_US
dc.subjectmultiple-input-multiple-output (MIMO)en_US
dc.subjectrobust channel estimationen_US
dc.subjectspatial correlationen_US
dc.subjectsuperimposed training (SIT) sequenceen_US
dc.titleRobust Training Sequence Design for Spatially Correlated MIMO Channel Estimationen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TVT.2011.2161640en_US
dc.identifier.journalIEEE TRANSACTIONS ON VEHICULAR TECHNOLOGYen_US
dc.citation.volume60en_US
dc.citation.issue7en_US
dc.citation.spage2882en_US
dc.citation.epage2894en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000297540900001-
dc.citation.woscount7-
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