統計資料
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| Constructing a yield model for integrated circuits based on a novel fuzzy variable of clustered defect pattern | 108 |
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| Constructing a yield model for integrated circuits based on a novel fuzzy variable of clustered defect pattern | 108 |
| 檢視 |
|---|
| 檢視 | |
|---|---|
| 中國 | 96 |
| 美國 | 11 |
| 台灣 | 1 |
| 檢視 | |
|---|---|
| Shenzhen | 96 |
| Menlo Park | 6 |
| Kensington | 3 |
| Edmond | 2 |
| Taipei | 1 |