標題: | Electroreflectance of surface-intrinsic- n(+)-type doped GaAs |
作者: | Wang, DP Huang, KM Shen, TL Huang, KF Huang, TC 電子物理學系 Department of Electrophysics |
公開日期: | 15-九月-1997 |
摘要: | The electroreflectance spectra of surface-intrinsic-n(+)-type-doped GaAs were measured at various bias voltages (V-bias). Results revealed many Franz-Keldysh oscillations (FKOs) above the band-gap energy, which have been attributed to a uniform electric field (F) in the undoped layer below the surface. However, there has been no other evidence for the uniformity of F in the undoped layer. Since it is known that F can be deduced from the periods of the FKOs, the relations between F and V-bias can, thereby, be obtained. The nearly linear relation, thus found, confirms the existence of a nearly uniform field in the undoped layer. From the plot of F against V-bias,the Values of the thickness of the undoped layer and the barrier height can also be evaluated. (C) 1997 American Institute of Physics. |
URI: | http://dx.doi.org/10.1063/1.366148 http://hdl.handle.net/11536/149654 |
ISSN: | 0021-8979 |
DOI: | 10.1063/1.366148 |
期刊: | JOURNAL OF APPLIED PHYSICS |
Volume: | 82 |
起始頁: | 3089 |
結束頁: | 3091 |
顯示於類別: | 期刊論文 |