Precision side-polished fibers with a long interaction length

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	Liaw, SK	en_US
dc.contributor.author	Chiu, JY	en_US
dc.contributor.author	Tseng, SM	en_US
dc.date.accessioned	2019-04-02T05:59:09Z	-
dc.date.available	2019-04-02T05:59:09Z	-
dc.date.issued	1997-09-15	en_US
dc.identifier.issn	0021-4922	en_US
dc.identifier.uri	http://dx.doi.org/10.1143/JJAP.36.L1179	en_US
dc.identifier.uri	http://hdl.handle.net/11536/149664	-
dc.description.abstract	We succeeded in fabricating precision side-polished fibers embedded in silicon V-grooves and then polished six fibers using a home-made polisher. The control of the polishing depth of the side-polished fibers was as accurate as +/-0.25 mu m. Another merit of our polished samples was their negligible losses even though the effective interaction lengths were long. Experimental calibrations of our samples agreed with theoretical results.	en_US
dc.language.iso	en_US	en_US
dc.subject	side-polished	en_US
dc.subject	negligible loss	en_US
dc.subject	long interaction length	en_US
dc.title	Precision side-polished fibers with a long interaction length	en_US
dc.type	Article	en_US
dc.identifier.doi	10.1143/JJAP.36.L1179	en_US
dc.identifier.journal	JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS	en_US
dc.citation.volume	36	en_US
dc.contributor.department	光電工程研究所	zh_TW
dc.contributor.department	Institute of EO Enginerring	en_US
dc.identifier.wosnumber	WOS:A1997YA47500016	en_US
dc.citation.woscount	4	en_US
顯示於類別：	期刊論文