| 標題: | Spectral Analysis of Noise Sources in InGaN Light Emitting Diodes |
| 作者: | Lin, Gray Su, Kuan-Lin Yang, Shih-Tsun Chen, Tzung-Te Chen, Chiu-Ling 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
| 公開日期: | 2011 |
| 摘要: | Noise characterization of InGaN light emitting diodes shows that the exponent in current dependence of low-frequency flicker noise amplitude and the corner frequency in high-frequency generation-recombination noise spectra are two possible indicators for device reliability. (C) 2010 Optical Society of America |
| URI: | http://hdl.handle.net/11536/14990 |
| ISBN: | 978-1-55752-910-7 |
| 期刊: | 2011 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) |
| Appears in Collections: | Conferences Paper |
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