| Title: | Investigation statistics of bipolar multilevel memristive mechanism and characterizations in a thin FeOx transition layer of TiN/SiO2/FeOx/Fe structure (vol 110, 053703, 2011) |
| Authors: | Chang, Yao-Feng Chang, Ting-Chang Chang, Chun-Yen 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
| Issue Date: | 1-Dec-2011 |
| URI: | http://dx.doi.org/10.1063/1.3668129 http://hdl.handle.net/11536/150427 |
| ISSN: | 0021-8979 |
| DOI: | 10.1063/1.3668129 |
| Journal: | JOURNAL OF APPLIED PHYSICS |
| Volume: | 110 |
| Appears in Collections: | Articles |
- Investigation statistics of bipolar multilevel memristive mechanism and characterizations in a thin FeO(x) transition layer of TiN/SiO(2)/FeO(x)/Fe structure (vol 110, 053703, 2011) / Chang, Yao-Feng;Chang, Ting-Chang;Chang, Chun-Yen
- Investigation statistics of bipolar multilevel memristive mechanism and characterizations in a thin FeO(x) transition layer of TiN/SiO(2)/FeO(x)/Fe structure / Chang, Yao-Feng;Chang, Ting-Chang;Chang, Chun-Yen
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