| 標題: | Investigation statistics of bipolar multilevel memristive mechanism and characterizations in a thin FeO(x) transition layer of TiN/SiO(2)/FeO(x)/Fe structure (vol 110, 053703, 2011) |
| 作者: | Chang, Yao-Feng Chang, Ting-Chang Chang, Chun-Yen 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
| 公開日期: | 1-十二月-2011 |
| 摘要: | |
| URI: | http://dx.doi.org/10.1063/1.3668129 http://hdl.handle.net/11536/15051 |
| ISSN: | 0021-8979 |
| DOI: | 10.1063/1.3668129 |
| 期刊: | JOURNAL OF APPLIED PHYSICS |
| Volume: | 110 |
| Issue: | 11 |
| 起始頁: | |
| 結束頁: | |
| 顯示於類別： | 期刊論文 |
- Investigation statistics of bipolar multilevel memristive mechanism and characterizations in a thin FeOx transition layer of TiN/SiO2/FeOx/Fe structure (vol 110, 053703, 2011) / Chang, Yao-Feng;Chang, Ting-Chang;Chang, Chun-Yen
- Investigation statistics of bipolar multilevel memristive mechanism and characterizations in a thin FeO(x) transition layer of TiN/SiO(2)/FeO(x)/Fe structure / Chang, Yao-Feng;Chang, Ting-Chang;Chang, Chun-Yen
Loading...