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dc.contributor.authorChang, Tzu-Yuehen_US
dc.contributor.authorChang, Chun-Lungen_US
dc.contributor.authorLee, Hsin-Yuen_US
dc.contributor.authorLee, Po-Tsungen_US
dc.date.accessioned2019-04-02T06:04:28Z-
dc.date.available2019-04-02T06:04:28Z-
dc.date.issued2010-01-01en_US
dc.identifier.issn0160-8371en_US
dc.identifier.urihttp://hdl.handle.net/11536/150520-
dc.description.abstractIn this study, the characteristics of both p-type and n-ype Metal-Insulator-Semiconductor (MIS) solar cells with sputtering SiO2 insulating layers fabricated by radio-frequency (RF) magnetron sputtering are investigated. The characteristics of MIS solar cells are considerably affected by the thickness of the SiO2 insulating layer and a hydrogen (H-2) annealing process. Moreover, the performance of MIS solar cells with sputtering SiO2 insulating layer can be greatly enhanced by depositing a SiNx passivation layer on top. It suggests that a sputtering SiO2 insulating layer is a good alternative insulating layer for MIS solar cells.en_US
dc.language.isoen_USen_US
dc.titleCharacteristics of MIS Solar Cells Using Sputtering SiO2 Insulating Layersen_US
dc.typeProceedings Paperen_US
dc.identifier.journal35TH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCEen_US
dc.citation.spage1318en_US
dc.citation.epage1321en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000287579501113en_US
dc.citation.woscount0en_US
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