完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Hung, Yu-Hsiang | en_US |
dc.contributor.author | Fang, Sheng-Hsin | en_US |
dc.contributor.author | Chen, Hung-Ming | en_US |
dc.contributor.author | Chen, Shen-Min | en_US |
dc.contributor.author | Lin, Chang-Tzu | en_US |
dc.contributor.author | Lee, Chia-Hsin | en_US |
dc.date.accessioned | 2019-04-02T06:04:50Z | - |
dc.date.available | 2019-04-02T06:04:50Z | - |
dc.date.issued | 2016-01-01 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1145/2902961.2902973 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/150668 | - |
dc.description.abstract | Due to near-threshold computing nowadays, voltage emergency is threatening our design margins very seriously. Noise sensors are inserted in order to prevent various integrity issues from happening during runtime. In this work, we use a new technique based on association rule mining to plan and place noise sensors. This new methodology can consider the miss rate (the probability of any node occurring voltage emergency without any detection by placed sensors) and simultaneously minimize the number of sensors utilized. The results show that our approach is very effective in converging the miss rate to zero by the least number of sensors. Compared with the state-of-the-art, we can reduce the number of sensors by half in benchmarks while the miss rate is comparable or even smaller than the prior work. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | Noise sensor placement | en_US |
dc.subject | Near threshold computing | en_US |
dc.subject | Power integrity | en_US |
dc.title | A New Methodology for Noise Sensor Placement Based on Association Rule Mining | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.doi | 10.1145/2902961.2902973 | en_US |
dc.identifier.journal | 2016 INTERNATIONAL GREAT LAKES SYMPOSIUM ON VLSI (GLSVLSI) | en_US |
dc.citation.spage | 81 | en_US |
dc.citation.epage | 86 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000389775900013 | en_US |
dc.citation.woscount | 0 | en_US |
顯示於類別: | 會議論文 |