Time-Correlated Crosstalk Measurements between CMOS Single-Photon Avalanche Diodes

Title:	Time-Correlated Crosstalk Measurements between CMOS Single-Photon Avalanche Diodes
Authors:	Wu, Dai-Rong Tsai, Chia-Ming Lin, Sheng-Di 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics
Keywords:	Single-photon avalanche diodes;crosstalk;time correlation;CMOS technology;breakdown flash
Issue Date:	1-Jan-2018
Abstract:	We investigate time-resolved crosstalk probability between single-photon avalanche diodes in CMOS technology. The time-correlated crosstalk measurements reveal an unusual double-peak feature. This behavior becomes more significant at higher excess bias voltages and shorter device-to-device distance and its physical reason will be discussed.
URI:	http://hdl.handle.net/11536/150925
ISSN:	2160-5033
Journal:	2018 INTERNATIONAL CONFERENCE ON OPTICAL MEMS AND NANOPHOTONICS (OMN)
Begin Page:	185
End Page:	186
Appears in Collections:	Conferences Paper