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dc.contributor.authorPan, Chi-Wenen_US
dc.contributor.authorLee, Yu-Minen_US
dc.date.accessioned2014-12-08T15:21:18Z-
dc.date.available2014-12-08T15:21:18Z-
dc.date.issued2011en_US
dc.identifier.isbn978-1-61284-914-0en_US
dc.identifier.issn1948-3295en_US
dc.identifier.urihttp://hdl.handle.net/11536/15111-
dc.description.abstractRedundant via insertion is a useful technique to alleviate the yield loss and elevate the reliability of VLSI designs. While extra vias are inserted into the design, the electronic properties of designed circuit might be altered, and the circuit timing might be changed and needs to be efficiently re-analyzed. Therefore, a fast timing (incremental timing) analyzer is required to assistant the redundant via insertion procedure. This work develops an efficient redundant via insertion method under timing constraints. Firstly, an effectively incremental circuit timing analysis method is developed, and the redundant via insertion task is transformed into a mixed bipartite-conflict graph matching problem. Then, the insertion problem is solved by a timing-driven minimum weighted matching algorithm. The experimental results show that the developed algorithm can achieve 3.2% extra insertion rates over the method without considering timing effects, which all redundant vias would be removed if the timing of that net does not meet the timing requirements, in average. In addition, the developed incremental timing analysis mechanism can speed up the runtime of redundant via insertion procedure under timing constraints by over 34 times in average.en_US
dc.language.isoen_USen_US
dc.titleRedundant Via Insertion under Timing Constraintsen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2011 12TH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN (ISQED)en_US
dc.citation.spage627en_US
dc.citation.epage633en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.identifier.wosnumberWOS:000299054300100-
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