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dc.contributor.authorLai, Bo-Cheng Charlesen_US
dc.contributor.authorChiang, Chih-Hsuanen_US
dc.contributor.authorLi, Guan-Ruen_US
dc.date.accessioned2014-12-08T15:21:18Z-
dc.date.available2014-12-08T15:21:18Z-
dc.date.issued2011en_US
dc.identifier.isbn978-0-7695-4576-9en_US
dc.identifier.issn1521-9097en_US
dc.identifier.urihttp://hdl.handle.net/11536/15122-
dc.identifier.urihttp://dx.doi.org/10.1109/ICPADS.2011.43en_US
dc.description.abstractObject detection has become an enabling function for modern smart embedded devices to perform intelligent applications and interact with the environment appropriately and promptly. However, the limited computation resource of embedded devices has become a barrier to execute the computation intensive object detection algorithm. Leveraging the multi-threading scheme on embedded multi-core systems provides an opportunity to boost the performance. However, the memory bottleneck limits the performance scalability. Improving data locality of applications and maximizing the data reuse for on-chip caches have therefore become critical design concerns. This paper comprehensively analyzes the memory behavior and data locality of a multi-threaded object detection algorithm. A novel Classifier-Grouping scheme is proposed to significantly enhance the data reuse for on-chip caches of embedded multi-core systems. By executing a multi-threaded object detection algorithm on a cycle-accurate multi-core simulator, the proposed approach can achieve up to 62% better performance when compared with the original parallel program.en_US
dc.language.isoen_USen_US
dc.subjectdata localityen_US
dc.subjectobject detectionen_US
dc.subjectparallel processingen_US
dc.subjectmulti-coreen_US
dc.subjectembedded deviceen_US
dc.titleClassifier Grouping to Enhance Data Locality for A Multi-Threaded Object Detection Algorithmen_US
dc.typeProceedings Paperen_US
dc.identifier.doi10.1109/ICPADS.2011.43en_US
dc.identifier.journal2011 IEEE 17TH INTERNATIONAL CONFERENCE ON PARALLEL AND DISTRIBUTED SYSTEMS (ICPADS)en_US
dc.citation.spage268en_US
dc.citation.epage275en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000299395900035-
Appears in Collections:Conferences Paper


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