Self-Heating Induced Feedback Effect on Drain Current Mismatch and Its Modeling

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DC 欄位	值	語言
dc.contributor.author	Kuo, Jack J-Y.	en_US
dc.contributor.author	Su, Pin	en_US
dc.date.accessioned	2014-12-08T15:21:19Z	-
dc.date.available	2014-12-08T15:21:19Z	-
dc.date.issued	2011	en_US
dc.identifier.isbn	978-1-4577-0505-2	en_US
dc.identifier.uri	http://hdl.handle.net/11536/15144	-
dc.description.abstract	We have reported and modeled a self-heating induced feedback effect on the drain current mismatch of nanoscale MOSFETs. The accuracy of the new model has been verified with experimental data. This effect needs to be considered when one-to-one comparisons between SOI and bulk devices regarding the variability are made.	en_US
dc.language.iso	en_US	en_US
dc.title	Self-Heating Induced Feedback Effect on Drain Current Mismatch and Its Modeling	en_US
dc.type	Proceedings Paper	en_US
dc.identifier.journal	2011 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM)	en_US
dc.contributor.department	電子工程學系及電子研究所	zh_TW
dc.contributor.department	Department of Electronics Engineering and Institute of Electronics	en_US
dc.identifier.wosnumber	WOS:000300015300028	-
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