標題: Influence of basal stacking faults on luminescence of m-plane Mg0.19Zn0.81O/ZnO quantum wells grown on a two-step MgZnO-buffer layer
作者: Wu, Yung-Chi
Chang, Ning-An
Yang, Tsung-Han
Tsai, Chih-Ya
Chen, Hou-Ren
Hsieh, Wen-Feng
電機學院
光電工程學系
College of Electrical and Computer Engineering
Department of Photonics
關鍵字: ZnO;nonpolar;basal stacking fault;m-plane
公開日期: 1-三月-2019
摘要: Different well widths of m-plane Mg0.19Zn0.81O/ZnO multiple quantum wells (MQWs) have been fabricated on the two-step pregrown MgZnO-buffered m-plane sapphires by a pulsed laser deposition and have a narrower linewidth on x-ray diffraction than ZnO-buffered MQWs. By using the variation method to calculate the band diagram and by corroborating the results of temperature-dependent photoluminescence, we confirm the binding energies of free exciton and basal-stacking-fault-bound exciton, which is composed of electrons in the barrier and confined hole in the narrow-width MQWs. The coupling of A1(LO) phonon with excitons in m-MQWs shows more sensitivity toward a decrease in well width than E2(low), due to the crystal symmetry and the reduced Bohr radius. (C) 2019 Society of Photo-Optical Instrumentation Engineers (SPIE)
URI: http://dx.doi.org/10.1117/1.OE.58.3.037106
http://hdl.handle.net/11536/151691
ISSN: 0091-3286
DOI: 10.1117/1.OE.58.3.037106
期刊: OPTICAL ENGINEERING
Volume: 58
Issue: 3
起始頁: 0
結束頁: 0
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