完整後設資料紀錄
DC 欄位語言
dc.contributor.authorHong, Hao-Chiaoen_US
dc.contributor.authorLin, Long-Yien_US
dc.contributor.authorChiu, Yien_US
dc.date.accessioned2019-06-03T01:08:31Z-
dc.date.available2019-06-03T01:08:31Z-
dc.date.issued2019-05-01en_US
dc.identifier.issn1549-8328en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TCSI.2018.2868241en_US
dc.identifier.urihttp://hdl.handle.net/11536/151909-
dc.description.abstractThis paper presents a 10-bit SAR ADC operating at a supply voltage (VDD) from 0.200 to 0.250 V. In the proposed ADC structure, the positive input of the comparator is fixed at VDD to bias the comparator's input transistor pair with a sufficient gate-to-source voltage at such a low VDD. We propose an ultra-low VDD temperature-compensated bias generator to bias the comparator for addressing the severe temperature-dependent issue of the MOSFETs in the comparator, which operate in the deep subthreshold region. Detailed circuit analysis and derivation of design requirements are presented. A double-boosted and low-leakage sampling switch is also proposed to alleviate the severe leakage issue at low sampling rates. A test chip has been designed and fabricated in 180-nm CMOS. The ADC core occupies only 0.024 mm(2). Measurement results show that the ADC achieves stable performance in the VDD range. At 0.225 V, the DNL and INL are within +1.04/-0.66 and +0.97/-1.04 LSB in the rail-to-rail input range, respectively. The measured peak SNDR at the Nyquist input frequency is 49.2 dB at 450 S/s. The whole ADC totally consumes 0.85 nW at 0.225 V including circuit leakages. The sub-nW power consumption makes it well suited for self-sustainable Internet-of-Things applications.en_US
dc.language.isoen_USen_US
dc.subjectSARen_US
dc.subjectADCen_US
dc.subjectSub-threshold operationen_US
dc.subjectlow-power/low voltage analog circuitsen_US
dc.titleDesign of a 0.20-0.25-V, Sub-nW, Rail-to-Rail, 10-bit SAR ADC for Self-Sustainable IoT Applicationsen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TCSI.2018.2868241en_US
dc.identifier.journalIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERSen_US
dc.citation.volume66en_US
dc.citation.issue5en_US
dc.citation.spage1840en_US
dc.citation.epage1852en_US
dc.contributor.department電機工程學系zh_TW
dc.contributor.departmentDepartment of Electrical and Computer Engineeringen_US
dc.identifier.wosnumberWOS:000465305700017en_US
dc.citation.woscount0en_US
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