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dc.contributor.authorLiu, Shao-Qien_US
dc.contributor.authorYen, Shun-Tungen_US
dc.date.accessioned2019-08-02T02:15:36Z-
dc.date.available2019-08-02T02:15:36Z-
dc.date.issued2019-06-28en_US
dc.identifier.issn0021-8979en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.5099073en_US
dc.identifier.urihttp://hdl.handle.net/11536/152266-
dc.description.abstractWe extract the parameters for the eight-band k . p model for Ge 1 - x Sn x ( x <= 0.15 ) from the calculation of the nonlocal empirical pseudopotential method with the modified virtual crystal approximation. The atomic pseudopotential form factors of Ge are improved such that the calculated Ge band structure has the commonly accepted bandgap and effective masses. The improved Ge parameters are used in proper interpolation to derive the parameters of GeSn for empirical pseudopotential calculation. The calculated band structures suggest that the Ge 1 - x Sn x alloys exhibit a transition between an indirect bandgap semiconductor and a direct one at Sn composition x c = 0.071. From the calculation, we extract the bandgap, the split-off energy, the interband momentum matrix element, and the effective masses of Ge 1 - x Sn x ( x <= 0.15) as functions of x. From these results, we further derive the parameters used in the eight-band k . p model. These parameters are well expressed in quadratic form. The k . p model with the extracted parameters can give an interband tunneling current in a pin diode that is consistent with the current calculated by the empirical pseudopotential method.en_US
dc.language.isoen_USen_US
dc.titleExtraction of eight-band k . p parameters from empirical pseudopotentials for GeSnen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.5099073en_US
dc.identifier.journalJOURNAL OF APPLIED PHYSICSen_US
dc.citation.volume125en_US
dc.citation.issue24en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000474439600048en_US
dc.citation.woscount0en_US
Appears in Collections:Articles