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dc.contributor.authorLu, Yi-Hsienen_US
dc.contributor.authorKuo, Po-Yien_US
dc.contributor.authorLin, Je-Weien_US
dc.contributor.authorWu, Yi-Hongen_US
dc.contributor.authorChen, Yi-Hsuanen_US
dc.contributor.authorChao, Tien-Shengen_US
dc.date.accessioned2014-12-08T15:21:25Z-
dc.date.available2014-12-08T15:21:25Z-
dc.date.issued2012-02-01en_US
dc.identifier.issn0741-3106en_US
dc.identifier.urihttp://dx.doi.org/10.1109/LED.2011.2175357en_US
dc.identifier.urihttp://hdl.handle.net/11536/15235-
dc.description.abstractFor the first time, we construct poly-Si thin-film transistors (TFTs) with novel L-shaped poly-Si fin channels (poly-Si TFTs with L-fin channels, called LFin-TFTs). The L-fin channels of LFin-TFTs are similar to the multiple-gated fin channels of FinFETs. The LFin-TFTs exhibit a low supply gate voltage (3 V), a good subthreshold swing (SS) similar to 190 mV/dec, and a high on/off current ratio (I-ON/I-OFF) > 10(6) (V-D = 1 V) without hydrogen-related plasma treatments. After Ni salicidation, the devices exhibit steep SS similar to 148 mV/dec and I-ON/I-OFF similar to 10(7). After NH3 plasma treatment, the characteristics of the devices are further improved. The LFin-TFTs have steeper SS similar to 132 mV/dec, higher I-ON/I-OFF > 10(7), and threshold voltage (V-TH) similar to 0.036 V.en_US
dc.language.isoen_USen_US
dc.subjectFinFETsen_US
dc.subjectL-finen_US
dc.subjectmultiple gateen_US
dc.subjectNH3 plasmaen_US
dc.subjectNi salicidationen_US
dc.subjectpoly-Si thin-film transistors (TFTs)en_US
dc.titleHigh-Performance Poly-Si Thin-Film Transistors With L-Fin Channelsen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/LED.2011.2175357en_US
dc.identifier.journalIEEE ELECTRON DEVICE LETTERSen_US
dc.citation.volume33en_US
dc.citation.issue2en_US
dc.citation.spage215en_US
dc.citation.epage217en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000299812300029-
dc.citation.woscount0-
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