標題: An analytical closed-form solution for multiple line supplier selection problem
作者: Pearn, W. L.
Tai, Y. T.
Tseng, S. C.
工業工程與管理學系
Department of Industrial Engineering and Management
關鍵字: Supplier selection;multiple line;process capability
公開日期: 4-Jul-2019
摘要: Supplier selection is an essential issue, particularly, for semiconductor manufacturing. Nowadays, since high demands in the globally competitive semiconductor manufacturing environment, multiple-line processes are quite commonly applied. In the paper, we consider a two-stage method composing of quality verification and selection decision for multiple-line supplier selection problems. Since quality performance is an important criterion in supplier selection, we test whether the new supplier has a significantly better capability than the existing supplier based on the multiple-line yield index in the stage of quality verification. In selection decision, when the magnitude of capability outperformance is significant, switching contracts to a new entrant supplier is suggested. In addition, analytical closed-form solutions for asymptotical critical values and required sample sizes are derived and tabulated for the investigated multiple-line supplier selection problem. We demonstrate the applicability of the proposed supplier selection method by presenting a real-world example taken from a semiconductor packaging shop floor located in the Science-based Industrial Park in Hsinchu, Taiwan.
URI: http://dx.doi.org/10.1080/16843703.2018.1430522
http://hdl.handle.net/11536/152408
ISSN: 1684-3703
DOI: 10.1080/16843703.2018.1430522
期刊: QUALITY TECHNOLOGY AND QUANTITATIVE MANAGEMENT
Volume: 16
Issue: 4
起始頁: 377
結束頁: 388
Appears in Collections:Articles