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dc.contributor.authorAhn, Hyeyoungen_US
dc.contributor.authorYu, Chih-Chengen_US
dc.contributor.authorYu, Pyngen_US
dc.contributor.authorTang, Jauen_US
dc.contributor.authorHong, Yu-Liangen_US
dc.contributor.authorGwo, Shangjren_US
dc.date.accessioned2014-12-08T15:21:28Z-
dc.date.available2014-12-08T15:21:28Z-
dc.date.issued2012-01-16en_US
dc.identifier.issn1094-4087en_US
dc.identifier.urihttp://dx.doi.org/10.1364/OE.20.000769en_US
dc.identifier.urihttp://hdl.handle.net/11536/15255-
dc.description.abstractIn this report, we investigated ultrafast carrier dynamics of vertically aligned indium nitride (InN) nanorod (NR) arrays grown by molecular-beam epitaxy on Si(111) substrates. Dominant band filling effects were observed and were attributed to a partial bleaching of absorption at the probe wavelengths near the absorption edge. Carrier relaxation in nanorod samples was strongly dependent on the rod size and length. In particular, a fast initial decay was observed for carriers in NRs with a small diameter (similar to 30 nm), the lifetime of which is much shorter than the carrier cooling time, demonstrating the substantial surface-associated influence on carrier relaxation in semiconductor nanostructures. (C)2012 Optical Society of Americaen_US
dc.language.isoen_USen_US
dc.titleCarrier dynamics in InN nanorod arraysen_US
dc.typeArticleen_US
dc.identifier.doi10.1364/OE.20.000769en_US
dc.identifier.journalOPTICS EXPRESSen_US
dc.citation.volume20en_US
dc.citation.issue2en_US
dc.citation.spage769en_US
dc.citation.epage775en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000300057700008-
dc.citation.woscount4-
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