統計資料
總造訪次數
| 檢視 | |
|---|---|
| Charge trapping induced frequency-dependence degradation in n-MOSFETs with high-k/metal gate stacks | 104 |
本月總瀏覽
檔案下載
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| 000299233000029.pdf | 8 |
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| 中國 | 95 |
| 美國 | 9 |
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| Shenzhen | 94 |
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| 檢視 | |
|---|---|
| Charge trapping induced frequency-dependence degradation in n-MOSFETs with high-k/metal gate stacks | 104 |
| 檢視 | |
|---|---|
| 000299233000029.pdf | 8 |
| 檢視 | |
|---|---|
| 中國 | 95 |
| 美國 | 9 |
| 檢視 | |
|---|---|
| Shenzhen | 94 |
| Kensington | 4 |
| Menlo Park | 4 |
| Beijing | 1 |
| Edmond | 1 |