標題: Capabilities of time-resolved X-ray excited optical luminescence of the Taiwan Photon Source 23A X-ray nanoprobe beamline
作者: Lin, Bi-Hsuan
Wu, Yu-Hao
Li, Xiao-Yun
Hsu, Hsu-Cheng
Chiu, Yu-Cheng
Lee, Chien-Yu
Chen, Bo-Yi
Yin, Gung-Chian
Tseng, Shao-Chin
Chang, Shih-Hung
Tang, Mau-Tsu
Hsieh, Wen-Feng
光電工程學系
光電工程研究所
Department of Photonics
Institute of EO Enginerring
關鍵字: XEOL;TR-XEOL;XRF;streak camera
公開日期: 1-Jan-2020
摘要: Time-resolved X-ray excited optical luminescence (TR-XEOL) was developed successfully for the 23A X-ray nanoprobe beamline located at the Taiwan Photon Source (TPS). The advantages of the TR-XEOL facility include (i) a nano-focused X-ray beam (<60 nm) with excellent spatial resolution and (ii) a streak camera that can simultaneously record the XEOL spectrum and decay time. Three time spans, including normal (30 ps to 2 ns), hybrid (30 ps to 310 ns) and single (30 ps to 1.72 mu s) bunch modes, are available at the TPS, which can fulfil different experimental conditions involving samples with various lifetimes. It is anticipated that TR-XEOL at the TPS X-ray nanoprobe could provide great characterization capabilities for investigating the dynamics of photonic materials.
URI: http://dx.doi.org/10.1107/S1600577519013675
http://hdl.handle.net/11536/153488
ISSN: 0909-0495
DOI: 10.1107/S1600577519013675
期刊: JOURNAL OF SYNCHROTRON RADIATION
Volume: 27
起始頁: 217
結束頁: 221
Appears in Collections:Articles