完整後設資料紀錄
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dc.contributor.authorTseng, Sian-Hongen_US
dc.contributor.authorChen, Hung-Yien_US
dc.contributor.authorHsu, Wei-Tingen_US
dc.contributor.authorWang, Hsiang-Chenen_US
dc.contributor.authorLi, Yuan-Yaoen_US
dc.contributor.authorChang, Wen-Haoen_US
dc.contributor.authorLu, Ming-Peien_US
dc.contributor.authorLu, Ming-Yenen_US
dc.date.accessioned2020-02-02T23:54:41Z-
dc.date.available2020-02-02T23:54:41Z-
dc.date.issued2019-12-19en_US
dc.identifier.issn1932-7447en_US
dc.identifier.urihttp://dx.doi.org/10.1021/acs.jpcc.9b09028en_US
dc.identifier.urihttp://hdl.handle.net/11536/153628-
dc.description.abstractThe growth of large-area MoS2 films was achieved through atmospheric pressure chemical vapor deposition via vapor management in this study. The thickness of the MoS2 film changed upon varying the amount of vapor deposited on the substrate. Gratifyingly, large-area monolayer MoS2 was obtained under controlled conditions. Studies using transmission electron microscopy and second harmonic generation confirmed that the MoS2 films were composed of grains having sizes ranging from 40 to 70 mu m. Flexible MoS2 device arrays were fabricated on a polyimide substrate; the device arrays displayed high spatial uniformity in their carrier transport properties. The contact metals affected the electrical characteristics of the MoS2 devices under strain; the sensitivity of devices featuring Schottky contacts was higher than that of those with ohmic contacts. Importantly, the device arrays exhibit sensitive and endurance performances under strain cycles of up to 10(5) times. These results suggest a means for the feasible growth of large-area single-layer MoS2 films, as well as the exploitation of flexible MoS2 device arrays in strain and human motion sensor applications.en_US
dc.language.isoen_USen_US
dc.titleInfluences of Contact Metals on the Performances of MoS2 Devices under Strainsen_US
dc.typeArticleen_US
dc.identifier.doi10.1021/acs.jpcc.9b09028en_US
dc.identifier.journalJOURNAL OF PHYSICAL CHEMISTRY Cen_US
dc.citation.volume123en_US
dc.citation.issue50en_US
dc.citation.spage30696en_US
dc.citation.epage30703en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000503919500073en_US
dc.citation.woscount0en_US
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