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dc.contributor.authorGuo, Jiun-Inen_US
dc.contributor.authorTsai, Chia-Chien_US
dc.contributor.authorYang, Yong-Hsiangen_US
dc.contributor.authorLin, Hung-Weien_US
dc.contributor.authorWu, Bo-Xunen_US
dc.contributor.authorKuo, Ted T.en_US
dc.contributor.authorWang, Li-Jenen_US
dc.date.accessioned2020-05-05T00:01:57Z-
dc.date.available2020-05-05T00:01:57Z-
dc.date.issued2019-01-01en_US
dc.identifier.isbn978-1-7281-1817-8en_US
dc.identifier.issn2163-3517en_US
dc.identifier.urihttp://hdl.handle.net/11536/154002-
dc.description.abstractThe embedded deep learning object detection model competition in IEEE MMSP2019 focuses on the object detection for sensing technology in autonomous driving vehicles, which aims at detecting small objects in worse conditions through embedded systems. We provide a dataset with 89,002 annotated images for training and 1,500 annotated images for validation. We test participants' models through 6,000 testing images, which are separated into 3,000 for qualification and 3,000 for finals. There are 87 teams of participants registered this competition and 14 teams submitted the team composition. At last there are nine teams entering the final competition and five teams submitting their final models that can be realized in NVIDIA Jetson TX-2. At the end, only one team's model passed the target accuracy requirement for grading and became the champion of the contest, which the winner is team R.JD.en_US
dc.language.isoen_USen_US
dc.subjectObject detectionen_US
dc.subjectAutonomous driving vehiclesen_US
dc.subjectEmbedded deep learningen_US
dc.titleSummary Embedded Deep Learning Object Detection Model Competitionen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2019 IEEE 21ST INTERNATIONAL WORKSHOP ON MULTIMEDIA SIGNAL PROCESSING (MMSP 2019)en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000520406300028en_US
dc.citation.woscount0en_US
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