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dc.contributor.authorWu, Yu-Hsunen_US
dc.contributor.authorWu, Jenq-Shinnen_US
dc.contributor.authorLin, Sheng-Dien_US
dc.date.accessioned2020-05-05T00:02:22Z-
dc.date.available2020-05-05T00:02:22Z-
dc.date.issued2020-04-01en_US
dc.identifier.issn0021-4922en_US
dc.identifier.urihttp://dx.doi.org/10.7567/1347-4065/ab65d5en_US
dc.identifier.urihttp://hdl.handle.net/11536/154180-
dc.description.abstractThe narrow-bandgap Sb-based semiconductors find their potential in various kinds of device applications such as high-speed, low-power transistors and mid-infrared diode lasers. However, epitaxial growth on the substrates that are commercially available in large sizes (for example, GaAs and Si) faces the fundamental challenge of lattice mismatch. Different from the conventional metamorphic growth employing a thick buffer, we adopt the approach of transforming an ultrathin epitaxial aluminum (Al) nanofilm into epitaxial AlSb to serve as the template for growth of antimonide structures. It is found that the process named "antimonidation" plays a critical role in Sb-based metamorphic growth. Our experimental results provide practical usefulness for growing semiconductor devices on lattice-mismatched substrates without using thick metamorphic buffer layers. (C) 2020 The Japan Society of Applied Physicsen_US
dc.language.isoen_USen_US
dc.titleAntimonidation of ultrathin epitaxial aluminum nanofilms for metamorphic growth of Sb-based structures on GaAs substratesen_US
dc.typeArticleen_US
dc.identifier.doi10.7567/1347-4065/ab65d5en_US
dc.identifier.journalJAPANESE JOURNAL OF APPLIED PHYSICSen_US
dc.citation.volume59en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000519630000119en_US
dc.citation.woscount0en_US
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