標題: Hotspot Detection in Integrated Circuits by Two-photon-fluorescence-based Thermal Microscope
作者: Zhuo, Guan-Yu
Yang, Zu-Po
Chan, Ming-Che
光電系統研究所
Institute of Photonic System
公開日期: 1-Jan-2018
摘要: For thermal images and related hotspot diagnosis on integrated circuits (ICs) during operation, we present a high temporal, spatial, and temperature resolution thermal microscope based on the thermal-optical properties of R6G thin film.
URI: http://hdl.handle.net/11536/154263
ISBN: 978-1-9435-8042-2
ISSN: 2160-9020
期刊: 2018 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO)
起始頁: 0
結束頁: 0
Appears in Collections:Conferences Paper