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dc.contributor.authorLin, Shou-Taien_US
dc.contributor.authorHung, Wei-Kuoen_US
dc.contributor.authorZhuo, Guan-Yuen_US
dc.contributor.authorWang, Hsien-Yien_US
dc.contributor.authorChan, Ming-Cheen_US
dc.date.accessioned2020-07-01T05:22:05Z-
dc.date.available2020-07-01T05:22:05Z-
dc.date.issued2020-05-26en_US
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://dx.doi.org/10.1063/5.0001774en_US
dc.identifier.urihttp://hdl.handle.net/11536/154500-
dc.description.abstractThis work describes non-invasive observations of dynamic thermal lensing in an end-pumped Nd:YVO4 laser. Measurements were obtained with a nanoscale optical ruler created using chromatic aberrations, pinholes, dispersive gratings, and position-sensitive detectors. This study reports on variations in thermally induced oscillations and on underdamping behavior in the regime of high pump power. Dynamic data related to the thermal behavior can be used to study the balance between driving forces (pumping and thermal stresses) and damping losses (cooling and output coupling). The non-invasive nature of the proposed scheme along with its sub-100-nm axial resolution, sub-millisecond time resolution, and simple configuration makes it widely applicable for studying heat-related phenomena within laser crystals. The preliminary results show that such non-invasive methods could be used to detect thermally induced nanoscale deformations in integrated circuits, high-power optoelectronic devices, and optical devices with high-power illumination.en_US
dc.language.isoen_USen_US
dc.titleDirect observation of dynamic thermal lensing in nanoscale surfaces/interfaces of end-pumped Nd:YVO4 laseren_US
dc.typeArticleen_US
dc.identifier.doi10.1063/5.0001774en_US
dc.identifier.journalAPPLIED PHYSICS LETTERSen_US
dc.citation.volume116en_US
dc.citation.issue21en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department光電系統研究所zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentInstitute of Photonic Systemen_US
dc.identifier.wosnumberWOS:000538135000001en_US
dc.citation.woscount0en_US
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