標題: VERY FAST SIMULATED ANNEALING FOR PATTERN DETECTION AND SEISMIC APPLICATIONS
作者: Huang, Kou-Yuan
Hsieh, Yueh-Hsun
資訊工程學系
Department of Computer Science
關鍵字: simulated annealing;fast simulated annealing;very fast simulated annealing;common depth point(CDP);velocity analysis
公開日期: 2011
摘要: We use three global optimization methods in the pattern parameter detection system, including simulated annealing (SA), fast simulated annealing (FSA) and very fast simulated annealing (VFSA). The sequential pattern parameter detection system can detect three types of patterns that include the lines, hyperbolas and ellipses in image. We use steps in the parameter detection for reducing the computation and getting fast convergence. This system has the capability of searching pattern parameter vectors with global minimal distance between the patterns and the image data. After the system is successful in image pattern detection, we apply it to detect the parameters of the hyperbolic patterns on real one-shot seismogram and seismic common depth point (CDP) gather data. This procedure provides an automatic velocity analysis method and improves the seismic interpretation and further seismic data processing.
URI: http://hdl.handle.net/11536/15462
ISBN: 978-1-4577-1005-6
期刊: 2011 IEEE INTERNATIONAL GEOSCIENCE AND REMOTE SENSING SYMPOSIUM (IGARSS)
起始頁: 499
結束頁: 502
Appears in Collections:Conferences Paper