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dc.contributor.authorKumar, Sujiten_US
dc.contributor.authorSharma, Anjalien_US
dc.contributor.authorHo, Yen Tengen_US
dc.contributor.authorPandey, Akhileshen_US
dc.contributor.authorTomar, Monikaen_US
dc.contributor.authorKapoor, A. K.en_US
dc.contributor.authorChang, Edward Yien_US
dc.contributor.authorGupta, Vinayen_US
dc.date.accessioned2020-10-05T01:59:43Z-
dc.date.available2020-10-05T01:59:43Z-
dc.date.issued2020-09-15en_US
dc.identifier.issn0925-8388en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.jallcom.2020.155222en_US
dc.identifier.urihttp://hdl.handle.net/11536/154856-
dc.description.abstractHighly efficient ultraviolet (UV) photodetector based on Molybdenum Disulfide (MoS2) layers has been fabricated using pulsed laser deposition (PLD) technique. Systematic layer dependent photoresponse studies have been performed from single layer to 10 layers of MoS2 by varying the laser pulses to see the effect of the number of layers on the photoelectrical measurements. Raman and Photoluminescence studies have been carried out to ensure the growth of high-quality MoS2 layers. Layers of MoS2 grown at 100 pulses were found to exhibit the characteristic Raman phonon modes i.e. E-2g(1) and A(1g )at 383.8 cm(-1) and 405.1 cm(-1) respectively and Photoluminescence (PL) spectra show B exciton peak for MoS2 at around 625 nm suggesting the growth of high-quality MoS2 layers. Atomic force microscopy (AFM) thickness profiling and cross sectional-high resolution transmission electron microscopy (HRTEM) analysis gives the thickness of grown MoS2 to be 2.074 nm and 1.94 nm, respectively, confirming the growth of trilayers of MoS2. X-ray photoelectron spectroscopy (XPS) spectra of the grown trilayer sample show characteristic peaks corresponding to Molybdenum and Sulphur doublet (Mo4+ 3d(5/2,3/2) and S 2p(3/2,1/2)) confirming the chemical state of pure MoS2 phase without the presence of any Molybdenum oxide state. Dynamic photoelectrical studies with Indium Tin Oxide (ITO) as contact electrode upon UV laser illumination show superior responsivity of 3 x 10(4) A/W at 24 mu W optical power of the incident laser (lambda = 365 nm) and very high detectivity of 1.81 x 10(14) Jones at a low applied bias of 2 V. The obtained results are highly encouraging for the realization of low power consumption and highly efficient UV photodetectors based on MoS2 layers. (C) 2020 Elsevier B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subject2D materialen_US
dc.subjectMoS2 layersen_US
dc.subjectPulsed laser deposition technique (PLD)en_US
dc.subjectRamanen_US
dc.subjectXPSen_US
dc.subjectAFMen_US
dc.subjectCross-sectional TEMen_US
dc.subjectUV photodetectoren_US
dc.subjectITO electrodeen_US
dc.titleHigh performance UV photodetector based on MoS2 layers grown by pulsed laser deposition techniqueen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.jallcom.2020.155222en_US
dc.identifier.journalJOURNAL OF ALLOYS AND COMPOUNDSen_US
dc.citation.volume835en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.identifier.wosnumberWOS:000546685800014en_US
dc.citation.woscount1en_US
Appears in Collections:Articles