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dc.contributor.authorZheng, Guang-Tingen_US
dc.contributor.authorLiu, Po-Tsunen_US
dc.contributor.authorDu, Chia-Hengen_US
dc.contributor.authorWang, Teng-Yuen_US
dc.date.accessioned2020-10-05T02:01:08Z-
dc.date.available2020-10-05T02:01:08Z-
dc.date.issued1970-01-01en_US
dc.identifier.issn1071-0922en_US
dc.identifier.urihttp://dx.doi.org/10.1002/jsid.953en_US
dc.identifier.urihttp://hdl.handle.net/11536/155180-
dc.description.abstractA hydrogenated amorphous silicon (a-Si:H) thin-film transistor (TFT) gate driver with negative bias stress on precharging node for noise sharing with high-reliability 10.7-in. automotive display has been proposed. The proposed circuit is composed of precharging block, pull-up and pull-down block, and noise-free block. The precharging block not only starts up the gate driver but also reduces noise with 33% duty cycle. Duplicate output signals are responsible for turning on next stage to decrease the loading of output of gate line. Moreover, negative bias voltage recovering of TFTs could be created by setting another lower voltage source to lower the threshold voltage degradation of TFTs. According to lifetime test results, the proposed gate driver of 708 stages passes the extreme temperature range test (90 degrees C and -40 degrees C) for simulation and -40 degrees C for measurement and remains stable over 800 h at 90 degrees C test. Finally, this design is successfully demonstrated in a 10.7-in. HD (1280 x RGB x 720) TFT-LCD panel.en_US
dc.language.isoen_USen_US
dc.subjectamorphous silicon (a-Si)en_US
dc.subjectgate driveren_US
dc.subjecthigh reliabilityen_US
dc.subjectthin-film transistor (TFT)en_US
dc.subjectthreshold voltageen_US
dc.titleHigh-reliability gate driver on array using noise sharing of precharging node for thin film transistor-liquid crystal display applicationen_US
dc.typeArticleen_US
dc.identifier.doi10.1002/jsid.953en_US
dc.identifier.journalJOURNAL OF THE SOCIETY FOR INFORMATION DISPLAYen_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department顯示科技研究所zh_TW
dc.contributor.departmentInstitute of Displayen_US
dc.identifier.wosnumberWOS:000552628600001en_US
dc.citation.woscount0en_US
Appears in Collections:Articles